Surface Morphology of Leakage Current Sources of 4H-SiC Schottky Barrier Diodes by Atomic Force Microscope
- 著者名:
- 掲載資料名:
- Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 717-720
- 発行年:
- 2012
- パート:
- 1
- 開始ページ:
- 375
- 終了ページ:
- 378
- 総ページ数:
- 4
- 出版情報:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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Impact of Surface Morphology above Threading Dislocations on Leakage Current in 4H-SiC Diodes
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Improvement of I-V Characteristics of Schottky Barrier Diode by 4H-SiC Surface Planarization
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New Separation Method of Threading Dislocations in 4H-SiC Epitaxial Layer by Molten KOH Etching
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