Effects of Sacrifice Oxidation on Characterization of Defects in High-Purity Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy
- 著者名:
- 掲載資料名:
- Silicon carbide and related materials 2011 : selected, peer reviewed papers from the 14th International Conference on Silicon Carbide and Related Materials 2011 (ICSCRM 2011), September 11-16, 2011, Cleveland, Ohio, USA
- シリーズ名:
- Materials science forum
- シリーズ巻号:
- 717-720
- 発行年:
- 2012
- パート:
- 1
- 開始ページ:
- 271
- 終了ページ:
- 274
- 総ページ数:
- 4
- 出版情報:
- Aedermannsdorf, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- 言語:
- 英語
- 請求記号:
- M23650
- 資料種別:
- 国際会議録
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2
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Characterization of Traps in Semi-Insulating 4H-SiC by Discharge Current Transient Spectroscopy
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11
国際会議録
Development of Large Diameter High-Purity Semi-Insulating 4H-SiC Wafers for Microwave Devices
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SPIE-The International Society for Optical Engineering |