Residual Stress Analysis of Textured Materials by X-Ray Diffraction Method

Residual Stress Analysis of Textured Materials by X-Ray Diffraction Method

著者名:

掲載資料名:

THERMEC 2011 : International Conference on Processing & Manufacturing of Advanced Materials : processing, fabrication, properties, applications, August 1-5, 2011, Quebec City, Canada

シリーズ名:

Materials science forum

シリーズ巻号:

706-709

発行年:

2012

パート:

3

開始ページ:

1673

終了ページ:

1678

総ページ数:

6

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00054200
シリーズID:	PA00000012
会議名:	THERMEC 2011, International Conference on Processing & Manufacturing of Advanced Materials
回次:	2011
会議開催地:	Quebec City, Canada
会議開催年:	2011.08.01-2011.08.05
論文注記:	THERMEC 2011, International Conference on Processing & Manufacturing of Advanced Materials, August 1-5, 2011, Quebec City, Canada

類似資料:

1 国際会議録 Application of Synchrotron Radiation to Residual Stress Analysis by IP/cosα Method T. Sasaki, Y. Miyazawa, S. Takahashi, R. Matsuyama, K. Sasaki Trans Tech Publications	7 国際会議録 Residual Stress in Railway Rails by IP/cosa Method Sasaki, T., Takahashi, S., Iwfuchi, K., Satoh, Y., Kanematsu, Y., Chiba, M., Takago, S. Trans Tech Publications
2 国際会議録 Influence of Interfacial Neighborhood on Residual Stress due to Deposition of TiN Thin Films Made by PVD Hirose, H., Suzuki, S., Gotoh, M., Sasaki, T. Trans Tech Publications	8 国際会議録 Analysis of Macro and Micro Residual Stresses in Functionally Graded Materials by Diffraction Methods Dantz, D., Genzel, Ch., Reimers, W. Trans Tech Publications
3 国際会議録 Analysis of Residual Stress in Polycrystalline Silver Thin Films by X-ray Diffraction Alford, T. L., Zeng, Yuxiao, Zou, Y. L., Deng, F., Lau, S. S., Laursen, T., Ullrich, B. Manfred MRS - Materials Research Society	9 国際会議録 Rietveld Texture and Stress Analysis of Thin Films by X-Ray Diffraction Lutterotti, L., Matthies, S., Chateigner, D., Ferrari, S., Ricote, J. Trans Tech Publications
4 国際会議録 X-Ray Stress Measurements of TiCN Thin Films Gotoh, M., Murotani, T., Sasaki, T., Hirose, Y. Trans Tech Publications	10 国際会議録 Determination of Shearing Stresses (τ_xz and τ_yz) Using X-Ray Diffraction Method with Two-Dimensional Detector T. Sasaki, J. Akita, Y. Sone, Y. Kobayashi Trans Tech Publications
5 国際会議録 X-Ray Stress Measurement of Carbide in Tool Steel Gotoh, M., Hirose, H., Sasaki, T. Trans Tech Publications	11 国際会議録 Experimental Comparison of In-Depth Residual Stresses Measured with Neutron and X-Ray Diffraction with a Numerical Stress Relaxation Correction Method B. Levieil, F. Bridier, C. Doudard, V. Klosek, D. Thévenet, S. Calloch Trans Tech Publications
6 国際会議録 Influence of Steel Grain Size on Residual Stress in Grinding Processing M. Gotoh, K. Seki, M. Shozu, H. Hirose, T. Sasaki Trans Tech Publications	12 国際会議録 X-Ray Stress Measurement of Austenitic Stainless Steel with cosα Method and Two-Dimensional X-Ray Detector T. Sasaki, H. Sato Trans Tech Publications

1

2

3

4

5

6

7

8

9

10

11

12