External Reference Samples for Residual Stress Analysis by X-Ray Diffraction

External Reference Samples for Residual Stress Analysis by X-Ray Diffraction

著者名:

掲載資料名:

Residual stresses VIII : selected, peer reviewed papers from the 8th European Conference on Residual Stresses, ECRS8, 2010, June 26-28, 2010, Riva del Garda, Italy

シリーズ名:

Materials science forum

シリーズ巻号:

681

発行年:

2011

開始ページ:

215

終了ページ:

222

総ページ数:

8

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00054178
シリーズID:	PA00000012
会議名:	European Conference on Residual Stresses, ECRS8
回次:	8th
会議開催地:	Riva del Garda, Italy
会議開催年:	2010.06.26-2010.06.28
論文注記:	8th European Conference on Residual Stresses, ECRS8, 2010, June 26-28, 2010, Riva del Garda, Italy

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2 国際会議録 Towards Reference Samples for X-Ray Residual Stress Analysis Botzon, R., Francois, M. Trans Tech Publications	8 国際会議録 ELASTIC MISFIT STRAIN RELAXATION IN HIGHLY STRAINED InAs DOTS ON GaAs AS STUDIED BY TEM, AFM AND VFF ATOMISTIC CALCULATIONS Androussi, Y., Francois, P., Lefebvre, A., Priester, C., Lefebvre, I., Allan, G., Lannoo, M., Moison, J. M., Lebouche, … MRS - Materials Research Society
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