Long Carrier Lifetime in 4H-SiC Epilayers Using Chlorinated Precursors

Long Carrier Lifetime in 4H-SiC Epilayers Using Chlorinated Precursors

著者名:

掲載資料名:

Silicon carbide and related materials 2008 : selected peer reviewed papers from the 7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain

シリーズ名:

Materials science forum

シリーズ巻号:

615-617

発行年:

2009

開始ページ:

291

終了ページ:

294

総ページ数:

4

出版情報:

Aedermannsdorf, Switzerland: Trans Tech Publications

ISSN:

02555476

言語:

英語

請求記号:

M23650

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00054140
シリーズID:	PA00000012
会議名:	European Conference on Silicon Carbide and Related Materials
回次:	7th
会議開催地:	Barcelona, Spain
会議開催年:	2008.09.07-2008.09.11
論文注記:	7th European Conference on Silicon Carbide and Related Materials, September 7-11 Barcelona, Spain

類似資料:

1 国際会議録 Variations in the Measured Carrier Lifetimes of n- 4H-SiC Epilayers P.B. Klein, J.D. Caldwell, A. Shrivastava, T.S. Sudarshan Trans Tech Publications	7 国際会議録 Long Charge Carrier Lifetime in As-Grown 4H-SiC Epilayer R. Karhu, I. Booker, I.G. Ivanov, E. Janzén, J. Ul Hassan Trans Tech Publications
2 国際会議録 Long Carrier Lifetimes in n-Type 4H-SiC Epilayers P.B. Klein Trans Tech Publications	8 国際会議録 Generation and Recombination Carrier Lifetimes in 4H SiC Epitaxial Wafers G.Y. Chung, M.J. Loboda, M.J. Marinella, D.K. Schroder, P.B. Klein Trans Tech Publications
3 国際会議録 Correlation of Extended Defects on Carrier Lifetime in Thick SiC Epilayers N.A. Mahadik, R.E. Stahlbush, J.D. Caldwell, M.J. O'Loughlin, A.A. Burk Trans Tech Publications	9 国際会議録 Influence of Growth Temperature on Carrier Lifetime in 4H-SiC Epilayers L. Lilja, J. ul Hassan, I.D. Booker, P. Bergman, E. Janzén Trans Tech Publications
4 国際会議録 Defects Limiting Minorty Carrier Lifetime in 4H-SiC Epilayers P. B. Klein, B. Shanabrook, S. Huh, A. Polyakov, M. Skowronski, J. Sumakeris, M. O'Loughlin Electrochemical Society	10 国際会議録 Modelling of Effective Minority Carrier Lifetime in 4H-SiC n-Type Epilayers D. Kaminzky, B. Kallinger, P. Berwian, M. Rommel, J. Friedrich Trans Tech Publications
5 国際会議録 Temperature Dependence of the Carrier Lifetime in 4H-SiC Epilayers P.B. Klein, R.L. Myers-Ward, K.K. Lew, B.L. VanMil, C.R. Eddy Jr. Trans Tech Publications	11 国際会議録 Evaluation of Long Carrier Lifetimes in Very Thick 4H-SiC Epilayers T. Miyazawa, M. Ito, H. Tsuchida Trans Tech Publications
6 国際会議録 Deep Traps and Charge Carrier Lifetimes in 4H-SiC Epilayers Huh, S.W., Sumakeris, J.J., Polyakov, A.Y., Skowronski, M., Klein, P.B., Shanabrook, B.V., O'Loughlin, M.J. Trans Tech Publications	12 国際会議録 Depth-Resolved Carrier Lifetime Measurements in 4H-SiC Epilayers Monitoring Carbon Vacancy Elimination A. Galeckas, H.M. Ayedh, J.P. Bergman, B.G. Svensson Trans Tech Publications

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