A Study of Electrical Properties of SiGe Film with Various Oxidation Conditions

A Study of Electrical Properties of SiGe Film with Various Oxidation Conditions

著者名:

掲載資料名:

Student Posters (General)

シリーズ名:

ECS transactions

シリーズ巻号:

11(20)

発行年:

2008

開始ページ:

91

終了ページ:

100

総ページ数:

10

出版情報:

Pennington, N.J.: Electrochemical Society

ISSN:

19385862

ISBN:

9781605601939 [1605601934]

言語:

英語

請求記号:

E23400/11-15 [20]

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013270
シリーズID:	PA00000034
会議名:	ECS Meeting
回次:	212th
会議開催地:	Washington, DC, USA
会議開催年:	2007.10.07-2007.10.12
論文注記:	212th ECS Meeting, October 7 - October 12, 2007, Washington, DC

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