Influence of Temperature on the Saturation of the Forward Voltage Drift in SiC Pin Diodes

Influence of Temperature on the Saturation of the Forward Voltage Drift in SiC Pin Diodes

著者名:

掲載資料名:

State-of-the-art program on compound semiconductors 47 (SOTAPOCS 47) and wide-bandgap semiconductor materials and devices 8

シリーズ名:

ECS transactions

シリーズ巻号:

11(5)

発行年:

2007

開始ページ:

239

終了ページ:

245

総ページ数:

7

出版情報:

Pennington, N.J.: Electrochemical Society

ISSN:

19385862

ISBN:

9781566775717 [156677571X]

言語:

英語

請求記号:

E23400/11-5

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00013284
シリーズID:	PA00000034
会議名:	ECS Meeting
回次:	212th
会議開催地:	Washington, DC, USA
会議開催年:	2007.10.07-2007.10.12
論文注記:	212th ECS Meeting : Wide-Bandgap Semiconductor Materials and Devices 8, October 7 - October 12, 2007, Washington, DC

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