Charge and Interface Traps in 1-Octadecene Monolayers on Silicon as a Function of Silicon Pretreatment and Deposition Regime

Charge and Interface Traps in 1-Octadecene Monolayers on Silicon as a Function of Silicon Pretreatment and Deposition Regime

著者名:

掲載資料名:

Electrochemical Deposition on Non-Metallic Surfaces, Patterned Substrates, and Templates

シリーズ名:

ECS transactions

シリーズ巻号:

3(21)

発行年:

2007

開始ページ:

15

終了ページ:

24

総ページ数:

10

出版情報:

Pennington, N.J.: Electrochemical Society

ISSN:

19385862

ISBN:

9781604233742 [1604233745]

言語:

英語

請求記号:

E23400/3-21 [21]

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00046553
シリーズID:	PA00000034
会議名:	ECS Meeting
回次:	210th
会議開催地:	Cancun, Mexico
会議開催年:	2006.10.29-2006.11.03
論文注記:	210th ECS Meeting, October 29-November 3, 2006, Cancun, Mexico

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