Dissolution Characteristics of Al<sub>2</sub>Cu and Al-4%Cu Thin Films

Dissolution Characteristics of Al₂Cu and Al-4%Cu Thin Films

著者名:

掲載資料名:

Critical factors in localized corrosion 5 : a symposium in honor of Hugh Isaacs

シリーズ名:

ECS transactions

シリーズ巻号:

3(31)

発行年:

2007

開始ページ:

227

終了ページ:

233

総ページ数:

7

出版情報:

Pennington, N.J.: Electrochemical Society

ISSN:

19385862

ISBN:

9781566775762 [1566775760]

言語:

英語

請求記号:

E23400/3-31

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00047121
シリーズID:	PA00000034
会議名:	Symposium on Critical Factors in Localized Corrosion ; Electrochemical Society Meeting
回次:	5th ; 210th
会議開催地:	Cancun, Mexico
会議開催年:	2006.10.29-2006.11.03
論文注記:	210th ECS Meeting, October 29-November 3, 2006, Cancun, Mexico

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1 国際会議録 CREVICE CORROSION INITIATION AT ENGINEERED Cu-RICH DEFECTS IN Al THIN FILMS Missert, N., Son, K.A., Wall, F.D., Barbour, J.C., Sullivan, J.P., Zavadil, K.R., Copeland, R.G., Martinez, M.A., … Electrochemical Society	7 国際会議録 Structural and Magnetic Investigation of Cu, Co Substituted NiFe₂O₄ Thin Films by Scanning Probe Microscopy (AFM, MFM) H. Sharma, N.S. Negi Trans Tech Publications
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Dissolution Characteristics of Al2Cu and Al-4%Cu Thin Films

類似資料:

Dissolution Characteristics of Al₂Cu and Al-4%Cu Thin Films