Strain Degradation in Strained-Si Layers Far Thicker than the Critical Thickness Grown on Relaxed Si0.65Ge0.35 Layers
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Comparative Analysis of Sintering Mn0.65Zn0.35Fe2O4 Ferrite by Microwave Energy and N2 Atmosphere
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0.35 um and sub-0.35 um Matal Stack Etch in a DPS Chamber - DPS Chamber and Process Characterization
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