Capacitance-Voltage (CV) Characterization of GaAs-Oxide Interfaces
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Electrochemical Society |
Materials Research Society |
Materials Research Society |
8
国際会議録
Mechanical Characterization of Thin Films by the Capacitance-Voltage Measurement of Microstructures
Trans Tech Publications |
SPIE-The International Society for Optical Engineering |
Electrochemical Society |
Electrochemical Society |
Materials Research Society |
Materials Research Society | |
Electrochemical Society |
Materials Research Society |