Blank Cover Image

Phase retrieval based wavefront sensing experimental implementation and wavefront sensing accuracy calibration

著者名:
  • H. Mao ( Beijing Institute of Technology, China )
  • X. Wang ( Beijing Institute of Technology, China )
  • D. Zhao ( Beijing Institute of Technology, China )
掲載資料名:
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7283
発行年:
2009
巻:
1
開始ページ:
72830L-1
終了ページ:
72830L-5
総ページ数:
5
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819475435 [0819475432]
言語:
英語
請求記号:
P63600/7283
資料種別:
国際会議録

類似資料:

H. Mao, X. Wang, D. Zhao

Society of Photo-optical Instrumentation Engineers

Wang, D., Qian, H., Yuan, X.

SPIE - The International Society of Optical Engineering

X. Wang, D. Zhao, H. Mao

Society of Photo-optical Instrumentation Engineers

Q. Cheng, D. Pan, D. Wang, J. Chen, T. Mao

Society of Photo-optical Instrumentation Engineers

X. Wang, H. Mao, D. Zhao

Society of Photo-optical Instrumentation Engineers

J. A. Georges III, P. Dorrance, K. Gleichman, J. Jonik, D. Liskow

Society of Photo-optical Instrumentation Engineers

X. Wang, H. Mao, D. Zhao

Society of Photo-optical Instrumentation Engineers

F. Zhang, G. Pedrini, W. Osten

SPIE - The International Society of Optical Engineering

Ellerbroek,B.L., Thelen,B.J., Lee,D.J., Carrara,D.A., Paxman,R.G.

SPIE-The International Society for Optical Engineering

Peng, B., Wan, X., Jin, H., Zhao, Y., Mao, H.

SPIE - The International Society of Optical Engineering

Atcheson, P.D., Acton, D.S., Lightsey, P.A.

SPIE-The International Society for Optical Engineering

Dolne,J.J., Tansey,R.J., Black,K.A., Deville,J.H., Cunningham,P.R., Widen,K.C., Hill,J.L., Idell,P.S.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12