The quantitative assessment of small structure imaging ability by terahertz wave

The quantitative assessment of small structure imaging ability by terahertz wave

著者名:

K. Yang ( Capital Normal Univ., China )
G. Zhao ( Capital Normal Univ., China )
C. Liang ( Capital Normal Univ., China )
C. Zhang ( Capital Normal Univ., China )

掲載資料名:

Microelectronic and optoelectronic devices and integration : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

7158

発行年:

2009

開始ページ:

71580R-1

終了ページ:

71580R-6

総ページ数:

6

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819474025 [0819474029]

言語:

英語

請求記号:

P63600/7158

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052789
シリーズID:	PA00000029
会議名:	International Conference on Optical Instruments and Technology
回次:	2008
会議開催地:	Beijing, China
会議開催年:	2008.11.16-2008.11.19
論文注記:	2008 International Conference on Optical Instruments and Technology, 16-19 November 2008, Beijing, China - Session 7, 71580R, 7158-22

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