Blank Cover Image

Evaluation of focus measures under different wavefront aberrations for deformable mirror control in adaptive optics systems

著者名:
  • H. Cho ( Korea Advanced Institute of Science and Technology, Republic of Korea )
  • X. Tao ( Korea Advanced Institute of Science and Technology, Republic of Korea )
  • D. Hong ( Korea Advanced Institute of Science and Technology, Republic of Korea )
掲載資料名:
Photonics, devices, and systems IV : 27-29 August 2008, Prague, Czech Republic
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7138
発行年:
2008
開始ページ:
713805-1
終了ページ:
713805-12
総ページ数:
12
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473790 [0819473790]
言語:
英語
請求記号:
P63600/7138
資料種別:
国際会議録

類似資料:

Hemmati, H., Chen, Y., Crossfield, I.

SPIE - The International Society of Optical Engineering

Hom,C.L., Dean,P.D., Winzer,S.R.

SPIE - The International Society for Optical Engineering

Hong, D., Tao, X.

SPIE - The International Society of Optical Engineering

Wang, J., Tao, X., Hong, D., Cho, H.

SPIE - The International Society of Optical Engineering

Li,Y., Du,X., Chen,D.

SPIE-The International Society for Optical Engineering

X. Tao, D. Hong, H. Cho

Society of Photo-optical Instrumentation Engineers

D. C. Chen, S. M. Jones, D. A. Silva, S. S. Olivier

SPIE - The International Society of Optical Engineering

Tao, X., Hong, D., Cho, H.

SPIE - The International Society of Optical Engineering

Owens, D., Schoen, M., Bush, K.

SPIE - The International Society of Optical Engineering

K. P. Vitayaudom, T. R. Vincent, J. D. Schmidt, D. J. Sanchez

Society of Photo-optical Instrumentation Engineers

Gavel,D.T., Bauman,B.J., Campbell,E.W., Carrano,C.J., Olivier,S.S.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12