Electron spin resonance spectroscopy investigation of ion beam sputtered Hf02 and Si02 thin films

Electron spin resonance spectroscopy investigation of ion beam sputtered Hf0₂ and Si0₂ thin films

著者名:

B. Langdon ( Colorado State Univ., United States )
D. Patel ( Colorado State Univ., United States )
E. Krous ( Colorado State Univ., United States )
P. Langston ( Colorado State Univ., United States )
C. S. Menoni ( Colorado State Univ., United States )

掲載資料名:

Laser-Induced Damage in Optical Materials: 2008

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

7132

発行年:

2008

開始ページ:

71320M-1

終了ページ:

71320M-5

総ページ数:

5

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819473660 [0819473669]

言語:

英語

請求記号:

P63600/7132

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052763
シリーズID:	PA00000029
会議名:	Laser Damege : Annual Boulder Damage Symposium - Laser-Induced Damage in Optical Materials
回次:	2008 : 40th
会議開催地:	Boulder, CO, USA
会議開催年:	2008.09.22-2008.09.24
論文注記:	Laser-Induced Damage in Optical Materials: 2008, 22-24 September 2008, Boulder, Colorado - Thin Film, 71320M, 7132-19

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