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Research on the image multilayer matching comparison method in PCB defects inspection

著者名:
  • X. Zhou ( Beijing Information Science and Technology Univ., China )
  • Y. Li ( Shin-Asahi Electric Co. Ltd., Japan )
  • G. Liu ( Beijing Information Science and Technology Univ., China )
掲載資料名:
Optoelectronic technology and instruments, control theory and automation, and space exploration : Seventh International Symposium on Instrumentation and Control Technology : 10-13 October 2008, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7129
発行年:
2008
開始ページ:
71290D-1
終了ページ:
71290D-8
総ページ数:
8
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473639 [0819473634]
言語:
英語
請求記号:
P63600/7129
資料種別:
国際会議録

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