MTF assessment of high resolution satellite images using ISO 12233 slanted-edge method
- 著者名:
- H. Hwang ( Satrec Initiative, Republic of Korea )
- Y.-W. Choi ( Satrec Initiative, Republic of Korea )
- S. Kwak ( Satrec Initiative, Republic of Korea )
- M. Kim ( Satrec Initiative, Republic of Korea )
- W. Park ( Satrec Initiative, Republic of Korea )
- 掲載資料名:
- Image and signal processing for remote sensing XIV : 15-18 September 2008, Cardiff, Wales, United Kingdom
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 7109
- 発行年:
- 2008
- パート:
- A
- 開始ページ:
- 710905-1
- 終了ページ:
- 710905-9
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819473400 [0819473405]
- 言語:
- 英語
- 請求記号:
- P63600/7109
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Fast MTF measurement of CMOS imagers at the chip level using ISO 12233 slanted-edge methodology
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |