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A simple system for measuring small phase retardation of an optical thin fil

著者名:
掲載資料名:
Advances in optical thin films III : 2-3 September 2008, Glasgow, United Kingdom
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7101
発行年:
2008
開始ページ:
71011H-1
終了ページ:
71011H-7
総ページ数:
7
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473318 [0819473316]
言語:
英語
請求記号:
P63600/7101
資料種別:
国際会議録

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