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X-ray microtomography: past and present

著者名:
掲載資料名:
Developments in X-ray tomography VI : 12-14 August 2008, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7078
発行年:
2008
開始ページ:
707803-1
終了ページ:
707803-11
総ページ数:
11
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472984 [0819472980]
言語:
英語
請求記号:
P63600/7078
資料種別:
国際会議録

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