Measurement method of optical scatter using a STAR GEM as a scatterometer
- 著者名:
- E. Kawate ( National Institute of Advanced Industrial Science and Technology, Japan )
- 掲載資料名:
- Reflection, scattering, and diffraction from surfaces : 11-12 August 2008, San Diego, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 7065
- 発行年:
- 2008
- 開始ページ:
- 706515-1
- 終了ページ:
- 706515-9
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819472854 [0819472859]
- 言語:
- 英語
- 請求記号:
- P63600/7065
- 資料種別:
- 国際会議録
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国際会議録
SOI waveguide fabrication process development using star coupler scattering loss measurements
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Optical inverse scattering phase method for nano-in-process measurement of microsurface profile
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