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Accelerated test for effect of moisture and temperature on glass-encapsulant interface

著者名:
  • S. Wu ( The Dow Chemical Co., United States )
  • J. Chen ( The Dow Chemical Co., United States )
  • B. Weaver ( The Dow Chemical Co., United States )
  • B. Sumner ( The Dow Chemical Co., United States )
  • V. Juarez ( The Dow Chemical Co., United States )
掲載資料名:
Reliability of photovoltaic cells, modules, components, and systems : 11-13 August 2008, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7048
発行年:
2008
開始ページ:
70480B-1
終了ページ:
70480B-10
総ページ数:
10
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472687 [0819472689]
言語:
英語
請求記号:
P63600/7048
資料種別:
国際会議録

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