Wide angle and broadband antireflection properties for a silicon nanotip array

Wide angle and broadband antireflection properties for a silicon nanotip array

著者名:

Y.-F. Huang ( National Taipei Univ. of Technology, Taiwan )
Y.-J. Jen ( National Taipei Univ. of Technology, Taiwan )
K. H. Chen ( Institute of Atomic and Molecular Sciences, Taiwan )
L.-C. Chen ( National Taiwan Univ., Taiwan )

掲載資料名:

Nanoengineering : fabrication, properties, optics, and devices V : 13-14 August 2008, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

7039

発行年:

2008

開始ページ:

70390W-1

終了ページ:

70390W-8

総ページ数:

8

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819472595 [081947259X]

言語:

英語

請求記号:

P63600/7039

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052670
シリーズID:	PA00000029
会議名:	SPIE NanoScience and Engineering : Nanoengineering
回次:	2008 : 5th
会議開催地:	San Diego, California, USA
会議開催年:	2008.08.13-2008.08.14
論文注記:	Nanoengineering--fabrication, properties, optics, and devices V, 13-14 August 2008, San Diego, California, USA - Session 8. High Aspect Ratio Nanopatterning, 70390W, 7039-32

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