Methods to directly measure the trapping potential in optical tweezers

Methods to directly measure the trapping potential in optical tweezers

著者名:

A. Balijepalli ( National Institute of Standards and Technology, United States )
T. W. LeBrun ( National Institute of Standards and Technology, United States )
J. J. Gorman ( National Institute of Standards and Technology, United States )
S. K. Gupta ( Univ. of Maryland, College Park, United States )

掲載資料名:

Optical trapping and optical micromanipulation V : 10-13 August, 2008, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

7038

発行年:

2008

開始ページ:

70380V-1

終了ページ:

70380V-12

総ページ数:

12

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819472588 [0819472581]

言語:

英語

請求記号:

P63600/7038

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052669
シリーズID:	PA00000029
会議名:	SPIE NanoScience and Engineering : Optical Trapping and Optical Micromanipulation
回次:	2008 : 5th
会議開催地:	San Diego, California, USA
会議開催年:	2008.08.10-2008.08.13
論文注記:	Optical trapping and optical micromanipulation V, 10-13 August 2008, San Diego, California, USA - Itty-Bitty Bits under Optical Control, 70380V, 7038-32

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