Optical phasing of a segmented mirror with subnanometer precision: experimental results of the APE Internal Metrology

Optical phasing of a segmented mirror with subnanometer precision: experimental results of the APE Internal Metrology

著者名:

R. Wilhelm ( FOGALE nanotech, France )
B. Luong ( FOGALE nanotech, France )
A. Courteville ( FOGALE nanotech, France )
S. Estival ( FOGALE nanotech, France )
F. Gonté ( European Southern Observatory, Germany )

掲載資料名:

Ground-based and airborne telescopes II

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

7012

発行年:

2008

巻:

1

開始ページ:

701212-1

終了ページ:

701212-12

総ページ数:

12

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819472229 [0819472220]

言語:

英語

請求記号:

P63600/7012

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052643
シリーズID:	PA00000029
会議名:	Astronomical Telescopes and Instrumentation : Ground-based and Airborne Telescopes
回次:	2008 : 2nd
会議開催地:	Marseille, France
会議開催年:	2008.06.23-2008.06.28
論文注記:	Ground-based and airborne telescopes II, 23-28 June 2008, Marseille, France - Session 8. Segmented Mirror Alignment and Phasing I, 701212, 7012-37

類似資料:

1 国際会議録 Shape measurements of a segmented mirror with nanometer accuracy: the APE internal metrology [6267-86] Wilhelm R., Courteville A., Estival S., Bietti A., Seiller V., Gonte F. SPIE - The International Society of Optical Engineering	7 国際会議録 Phase coding for holographic memory using a deformable membrane mirror Gonte,F., Dandliker,R. SPIE-The International Society for Optical Engineering
2 国際会議録 APE: a breadboard to evaluate new phasing technologies for a future European Giant Optical Telescope Gonte, F. Y. J., Yaitskova, N., Dierickx, P., Karban, R., Courteville, A., Schumacher, A., Devaney, N., Esposito, S., … SPIE - The International Society of Optical Engineering	8 国際会議録 On-axis, non-contact measurement of glass thicknesses and airgaps in optical systems with submicron accuracy R. Wilhelm, A. Courteville, F. Garcia, F. de Vecchi SPIE - The International Society of Optical Engineering
3 国際会議録 APE: the Active Phasing Experiment to test new control system and phasing technology for a European Extremely Large Optical Telescope [5894-35] Gonte, F., Yaitskova, N., Derie, F., Constanza, A., Brast, R., Buzzoni, B., Delabre, B., Dierickx, P., Dupuy, C., … SPIE - The International Society of Optical Engineering	9 国際会議録 ASM: a scaled down Active Segmented Mirror for the Active Phasing Experiment C. Dupuy, F. Gonté, C. Frank Society of Photo-optical Instrumentation Engineers
4 国際会議録 Contact-free on-axis metrology for the fabrication and testing of complex optical systems [5965-36] Courteville, A., Wilhelm, R., Delaveau, M., Garcia, F., de Vecchi, F. SPIE - The International Society of Optical Engineering	10 国際会議録 Position sensors for segmented mirror Roziere, D., Buous, S., Courteville, A. SPIE - The International Society of Optical Engineering
5 国際会議録 Preliminary results obtained with the ZEUS phasing sensor within the APE experiment I. Surdej, B. Luong, A. Vigan, C. Araujo, R. Bourtembourg Society of Photo-optical Instrumentation Engineers	11 国際会議録 Dimensional metrology for the fabrication of imaging optics using a high accuracy low coherence interferometer [5856-41] Wilhelm, R., Courteville, A., Garcia, F., FOGALE nanotech (France) SPIE - The International Society of Optical Engineering
6 国際会議録 Results from the capacitive edge sensing system for the active alignment of the SALT primary mirror [6267-80] Gajjar H., Menzies J., Swiegers J., Roziere D,., Courteville A., Buous S., Luong B. SPIE - The International Society of Optical Engineering	12 国際会議録 A novel low-coherence fibre optic interferometer for position and thickness measurements with unattained accuracy [6341-62] Courteville, A., Wilhelm, R., Garcia, F. SPIE - The International Society of Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12