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Pico meter metrology for the GAIA mission

著者名:
掲載資料名:
Space telescopes and instrumentation 2008 : optical, infrared, and millimeter : 23-28 June 2008, Marseille, France
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
7010
発行年:
2008
巻:
2
開始ページ:
70102O-1
終了ページ:
70102O-10
総ページ数:
10
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472205 [0819472204]
言語:
英語
請求記号:
P63600/7010
資料種別:
国際会議録

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