Post-decomposition assessment of double patterning layout
- 著者名:
- J. Rubinstein ( UC Berkeley, USA )
- A. R. Neureuther ( UC Berkeley, USA )
- 掲載資料名:
- Optical Microlithography XXI
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6924
- 発行年:
- 2008
- 巻:
- 1
- 開始ページ:
- 69240O-1
- 終了ページ:
- 69240O-12
- 総ページ数:
- 12
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819471093 [0819471097]
- 言語:
- 英語
- 請求記号:
- P63600/6924
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
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Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
11
国際会議録
Pattern split rules! A feasibility study of rule based pitch decomposition for double patterning
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SPIE-The International Society for Optical Engineering |
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国際会議録
Development of layout split algorithms and printability evaluation for double patterning technology
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