Patterning fidelity on low-energy multiple-electron-beam direct write lithography
- 著者名:
- S. M. Chang ( Taiwan Semiconductor Manufacturing Co., Taiwan )
- S. J. Lin ( Taiwan Semiconductor Manufacturing Co., Taiwan )
- C. A. Lin ( Taiwan Semiconductor Manufacturing Co., Taiwan )
- J. H. Chen ( Taiwan Semiconductor Manufacturing Co., Taiwan )
- T. S. Gau ( Taiwan Semiconductor Manufacturing Co., Taiwan )
- 掲載資料名:
- Emerging lithographic technologies XII
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6921
- 発行年:
- 2008
- 巻:
- 1
- 開始ページ:
- 69211R-1
- 終了ページ:
- 69211R-9
- 総ページ数:
- 9
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819471062 [0819471062]
- 言語:
- 英語
- 請求記号:
- P63600/6921
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
2
国際会議録
Immersion defect reduction, part II: the formation mechanism and reduction of patterned defects
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
10
国際会議録
Effect of novel rinsing material and surfactant treatment on the resist pattern performance
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
6
国際会議録
Quantification of CD-SEM wafer global charging effect on CD and CD uniformity of 193-nm lithography
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |