Blank Cover Image

A DICOM-RT radiation oncology ePR with decision support utilizing quantified knowledge base from historical data

著者名:
  • J. R. Documet ( Univ. of Southern California, USA )
  • B. Liu ( Univ. of Southern California, USA )
  • A. Le ( Univ. of Southern California, USA )
  • M. Law ( The Hong Kong Polytechnic Univ., Hong Kong China )
掲載資料名:
Medical imaging 2008, PACS and imaging informatics : 20-21 February 2008, San Diego, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6919
発行年:
2008
開始ページ:
691905-1
終了ページ:
691905-6
総ページ数:
6
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
16057422
ISBN:
9780819471031 [0819471038]
言語:
英語
請求記号:
P63600/6919
資料種別:
国際会議録

類似資料:

Liu, B J, Law, M., Huang, H. K., Zee, C S, Chan, L

SPIE - The International Society of Optical Engineering

Z. Zhou, K. Ma, E. Talini, J. Documet, J. Lee, B. Liu

SPIE - The International Society of Optical Engineering

J. Documet, B. Liu, Z. Zhou, H. Huang, L. Documet

SPIE - The International Society of Optical Engineering

Liu, B.J., Documet, L., Documet, J., Huang, H.K., Muldoon, J.

SPIE - The International Society of Optical Engineering

A. Le, J. Documet, A. Joseph, R. Schulte, B. Liu

Society of Photo-optical Instrumentation Engineers

Z. Zhou, S. S. Chao, J. Lee, B. Liu, J. Documet, H. K. Huang

SPIE - The International Society of Optical Engineering

Liu, B. J., Law, M., Huang, H. K., Zee, C. S., Chan, L.

SPIE - The International Society of Optical Engineering

Law, M.Y.Y., Huang, H.K., Zhang, X., Zhang, J.

SPIE-The International Society for Optical Engineering

Documet, J., Zhou, Z., Liu, B.J., King, N., Huang, H. K.

SPIE - The International Society of Optical Engineering

Liu, B.J., Documet, L., Documet, J., Huang, H.K., Muldoon, J.

SPIE - The International Society of Optical Engineering

B. J. Liu, H. K. Huang, M. Law, A. Le, J. Documet, A. Gertych

SPIE - The International Society of Optical Engineering

Liu, B. J., Chao, S. SD., Documet, J., Lee, J., Lee, M., Topic, I., Williams, L.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12