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Combined nanoprobes for scanning probe microscopy: laser technology for processing and testing

著者名:
  • V. P. Veiko ( St. Petersburg State Univ. of Information Technologies, Mechanics and Optics, Russia )
  • A. O. Golubok ( St. Petersburg State Univ. of Information Technologies, Mechanics and Optics, Russia )
  • Z. Zuong ( St. Petersburg State Univ. of Information Technologies, Mechanics and Optics, Russia )
  • N. V. Varkentina ( St. Petersburg State Univ. of Information Technologies, Mechanics and Optics, Russia )
  • E. B. Yakovlev ( St. Petersburg State Univ. of Information Technologies, Mechanics and Optics, Russia )
掲載資料名:
Photon processing in microelectronics and photonics VII : 21-24 January 2008, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6879
発行年:
2008
パート:
A
開始ページ:
68791W-1
終了ページ:
68791W-10
総ページ数:
10
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470546 [0819470546]
言語:
英語
請求記号:
P63600/6879
資料種別:
国際会議録

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