Confocal scanning microscopy with multiple optical probes for high speed measurements and better imaging
- 著者名:
- W. Chun ( Korea Advanced Institute of Science and Technology, South Korea )
- S. Lee ( Korea Advanced Institute of Science and Technology, South Korea )
- D.-G. Gweon ( Korea Advanced Institute of Science and Technology, South Korea )
- 掲載資料名:
- Three-dimensional and multidimensional microscopy : image acquisition and processing XV : 21 and 23-24 January 2008, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6861
- 発行年:
- 2008
- 開始ページ:
- 686115-1
- 終了ページ:
- 686115-10
- 総ページ数:
- 10
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 16057422
- ISBN:
- 9780819470362 [0819470368]
- 言語:
- 英語
- 請求記号:
- P63600/6861
- 資料種別:
- 国際会議録
類似資料:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
2
国際会議録
Optimum conditions for high-quality 3D reconstruction in confocal scanning microscopy [6090-32]
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |