Study of uncooled thermal imaging system with multiple working temperatures

Study of uncooled thermal imaging system with multiple working temperatures

著者名:

J. Zhang ( Nanjing Univ. of Science and Technology, China )
T. Si ( Nanjing Univ. of Science and Technology, China )
L. Sun ( Nanjing Univ. of Science and Technology, China )
B. Chang ( Nanjing Univ. of Science and Technology, China )
Y. Qian ( Nanjing Univ. of Science and Technology, China )

掲載資料名:

Infrared materials, devices, and applications : 12-15 November 2007, Beijing, China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6835

発行年:

2008

開始ページ:

683520-1

終了ページ:

683520-8

総ページ数:

8

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819470102 [0819470104]

言語:

英語

請求記号:

P63600/6835

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052466
シリーズID:	PA00000029
会議名:	Photonics Asia : Infrared Materials, Devices, and Applications
回次:	2007
会議開催地:	Beijing, China
会議開催年:	2007.11.12-2007.11.15
論文注記:	Infrared materials, devices, and applications, 12-15 November 2007, Beijing, China - Poster Session (683520/6835-96)

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1 国際会議録 Study of uncooled thermal imaging system with multiple working temperatures J. Zhang, L. Sun, Y. Qian, B. Chang, S. Tian Society of Photo-optical Instrumentation Engineers	7 国際会議録 The nonuniformity measurement and image processing algorithm evaluation for uncooled microbolometer infrared focal plane arrays Qian, Y., Chang, B., Zhang, J., Xing, S., Yu, S., Yang, J. SPIE - The International Society of Optical Engineering
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