Blank Cover Image

A wavelength calibration process for micro-spectrometers with multichannel detectors

著者名:
  • W. Huang ( Tsinghua Univ., China )
  • H. Yang ( Tsinghua Univ., China )
  • Q. He ( Tsinghua Univ., China )
  • G. Jin ( Tsinghua Univ., China )
掲載資料名:
Advanced materials and devices for sensing and imaging III : 12-14 November 2007, Beijing, China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6829
発行年:
2008
開始ページ:
68291Q-1
終了ページ:
68291Q-11
総ページ数:
11
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470041 [081947004X]
言語:
英語
請求記号:
P63600/6829
資料種別:
国際会議録

類似資料:

Y. Wang, Y. Zhang, Y. Wu, S. Chen, Z. Qiu

Society of Photo-optical Instrumentation Engineers

Qu, Z., Yang, H., He, S., He, Q., Jin, G.

SPIE - The International Society of Optical Engineering

Feng,W., Yan,Y., Jin,G., Wu,M., He,Q.

SPIE - The International Society for Optical Engineering

Cai, D., Tan, Q., Yan, Y., Jin, G., He, Q.

SPIE - The International Society of Optical Engineering

Yang, H., Xu, L., He, Q., He, S., Jin, G.

SPIE - The International Society of Optical Engineering

Best,F.A., Revercomb,H.E., Bingham,G.E., Knuteson,R.O., Tobin,D.C., LaPorte,D.D., Smith,W.L.

SPIE-The International Society for Optical Engineering

H. Yang, L. Xu, K. Chen, X. Huang, Q. He

Society of Photo-optical Instrumentation Engineers

Long, H., He, Q.S., Wu, M.X., Jin, G.F.

SPIE-The International Society for Optical Engineering

H. Yang, K. Chen, X. Huang, Q. He, G. Jin

Society of Photo-optical Instrumentation Engineers

Yoon,H.J., Kim,J.H., Park,T.G., Yang,S.S., Jung,K.W.

SPIE-The International Society for Optical Engineering

Liu,H., Wu,M., Jin,G., Cheng,G., He,Q., Yan,Y.

SPIE-The International Society for Optical Engineering

Jin,W., Liu,G., He,Y., Guo,H., Su,X., Gao,Z.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12