A wavelength calibration process for micro-spectrometers with multichannel detectors
- 著者名:
- 掲載資料名:
- Advanced materials and devices for sensing and imaging III : 12-14 November 2007, Beijing, China
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6829
- 発行年:
- 2008
- 開始ページ:
- 68291Q-1
- 終了ページ:
- 68291Q-11
- 総ページ数:
- 11
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819470041 [081947004X]
- 言語:
- 英語
- 請求記号:
- P63600/6829
- 資料種別:
- 国際会議録
類似資料:
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
3
国際会議録
Improved subpixel analysis algorithm for geometrical superresolution in miniature spectrometer
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
10
国際会議録
Novel spectral device based on volume holography for integrated and miniature spectrometers
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |