Blank Cover Image

Volumetric fMRI data analysis using an iterative classification method

著者名:
掲載資料名:
Computational imaging VI : 28-29 January, 2008, San Jose, California, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6814
発行年:
2008
開始ページ:
68140E-1
終了ページ:
68140E-7
総ページ数:
7
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469861 [0819469866]
言語:
英語
請求記号:
P63600/6814
資料種別:
国際会議録

類似資料:

L. Liu, A. A. Rao, T. M. Talavage

SPIE - The International Society of Optical Engineering

Sato,M., Liu,Y., Takahashi,H., Nakajima,M.

SPIE-The International Society for Optical Engineering

L. Huang, M. L. Comer, T. M. Talavage

Society of Photo-optical Instrumentation Engineers

Borgonovi, G.M., Holslin, D.T., Collins, L.M., Tantum, S.L.

SPIE - The International Society of Optical Engineering

Feilner,M., Blu,T., Unser,M.A.

SPIE - The International Society for Optical Engineering

McColl,R.W., Blackburn,T.J., Peshock,R.M.

SPIE-The International Society for Optical Engineering

Feilner,M., Blu,T., Unser,M.A.

SPIE-The International Society for Optical Engineering

Hwang, E., Yoon, P., Kim, K., Park, J., Lee, J.

SPIE - The International Society of Optical Engineering

Lange, O., Meyer-Base, A., Meyer-Base, U. H., Wismuller, A., Hurdal, M.

SPIE - The International Society of Optical Engineering

Wang, X., Tian, J., Yang, L., Hu, J.

SPIE - The International Society of Optical Engineering

Wu, X., Long, Z., Yao, L, Chen, K

SPIE - The International Society of Optical Engineering

L. Chaillou, I. S. Yetik, M. N. Wernick

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12