Printer resolution measurement based on slanted edge method
- 著者名:
- Y. Bang ( Samsung Electronics Co. Ltd., South Korea )
- S. H. Kim ( Samsung Electronics Co. Ltd., South Korea )
- D. C. Choi ( Samsung Electronics Co. Ltd., South Korea )
- 掲載資料名:
- Image quality and system performance V : 28-30 January 2008, San Jose, California, USA
- シリーズ名:
- Proceedings of SPIE - the International Society for Optical Engineering
- シリーズ巻号:
- 6808
- 発行年:
- 2008
- 開始ページ:
- 680807-1
- 終了ページ:
- 680807-8
- 出版情報:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819469809 [0819469807]
- 言語:
- 英語
- 請求記号:
- P63600/6808
- 資料種別:
- 国際会議録
類似資料:
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |