Blank Cover Image

Disparity-based quality function for autostereoscopic display devices

著者名:
  • J.-Y. Son ( Daegu Univ., South Korea )
  • V. V. Saveljev ( Hanyang Univ., South Korea )
  • M.-C. Park ( Korea Institute of Science and Technology, South Korea )
  • D.-S. Kim ( Samsung Electronics Co., Ltd., South Korea )
  • S.-K. Kim ( Korea Institute of Science and Technology, South Korea )
掲載資料名:
Three-dimensional TV, video, and display VI : 11-12 September 2007, Boston, Massachusetts, USA
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6778
発行年:
2007
開始ページ:
677804-1
終了ページ:
677804-10
総ページ数:
10
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469380 [0819469386]
言語:
英語
請求記号:
P63600/6778
資料種別:
国際会議録

類似資料:

Saveljev, V. V., Son, J. -Y., Cha, K. -H.

SPIE - The International Society of Optical Engineering

S.-K. Kim, D.-W. Kim, M.-C. Park, Y.-M. Kwon, J.-Y. Son

SPIE - The International Society of Optical Engineering

Son J.-Y., Saveljev V. V., Kim D.-S., Kim S.-K., Park M.-C.

SPIE - The International Society of Optical Engineering

S.-K. Kim, D.-W. Kim, M.-C. Park, J.-Y. Son

Society of Photo-optical Instrumentation Engineers

Lee,S.-H., Yang,H.-G., Yi,S.-Y., Son,K.-C., Kim,E.-S.

SPIE - The International Society for Optical Engineering

Son, J.-Y., Saveljev, V. V., Kim, D.-S., Kim, K.-T.

SPIE - The International Society of Optical Engineering

Tomono, T., Cha, K. H., Ha, Y. S., Kim, S.-S., Son, J.-Y.

SPIE-The International Society for Optical Engineering

J. -Y. Son, S. H. Kim, M. -C. Park, S. -K. Kim

Society of Photo-optical Instrumentation Engineers

J.-Y. Son, V. V. Saveljev, K.-H. Cha, S. Kim, M.-C. Park, S.-H. Jang

SPIE - The International Society of Optical Engineering

Park, Y.-G., Bae, K. H., Ko, J.-H., Kim, E.-S.

SPIE - The International Society of Optical Engineering

Son, J.-Y., Saveljev, V.V., Choi, Y.-J., Bahn, J.-E., Kim, S.S.

SPIE - The International Society of Optical Engineering

J. J. Yoo, Y. Kim, M. R. Luo, W. Choi, S. Lee, D. S. Park, C. Y. Kim

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12