Photovoltaic effect of different thickness vanadium oxide thin film

Photovoltaic effect of different thickness vanadium oxide thin film

著者名:

X. Wei ( Univ. of Electronic Science and Technology of China, China )
Z. Wu ( Univ. of Electronic Science and Technology of China, China )
T. Wang ( Univ. of Electronic Science and Technology of China, China )
S. Li ( Univ. of Electronic Science and Technology of China, China )
J. Tang ( Univ. of Electronic Science and Technology of China, China )

掲載資料名:

Optical test and measurement technology and equipment

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6723

発行年:

2007

巻:

2

開始ページ:

672342-1

終了ページ:

672342-5

総ページ数:

5

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468802 [0819468800]

言語:

英語

請求記号:

P63600/6723

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052369
シリーズID:	PA00000029
会議名:	International Symposium on Advanced Optical Manufacturing and Testing Technologies
回次:	2007 : 3rd
会議開催地:	Chengdu, China
会議開催年:	2007.07.08-2007.07.12
論文注記:	3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 8-12 July 2007, Chengdu, China - Potser session (6723-145)

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