High-resolution digital holography for shape measurement of microscopic object

High-resolution digital holography for shape measurement of microscopic object

著者名:

H. Wang ( Hebei Univ of Engineering, China )
B. Zhao ( Hebei Univ. of Engineering, China )
D. Wang ( Beijing Univ. of Technology, China )
G. Wang ( Beijing Univ. of Technology, China )
J. Zhao ( Beijing Univ. of Technology, China )

掲載資料名:

Optical test and measurement technology and equipment

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6723

発行年:

2007

巻:

2

開始ページ:

67233Y-1

終了ページ:

67233Y-7

総ページ数:

7

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468802 [0819468800]

言語:

英語

請求記号:

P63600/6723

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052369
シリーズID:	PA00000029
会議名:	International Symposium on Advanced Optical Manufacturing and Testing Technologies
回次:	2007 : 3rd
会議開催地:	Chengdu, China
会議開催年:	2007.07.08-2007.07.12
論文注記:	3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies, 8-12 July 2007, Chengdu, China - Potser session (6723-141)

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6 国際会議録 Particle shape recognition using digital holography Lu, Q.N., Zhang, Y.M., Ge, B.Z., Zhao, H.Y., Luo, W.G., Qiao, P. SPIE-The International Society for Optical Engineering	12 国際会議録 Resolution analysis of digital holography [6027-127] Fan Q., Zhao J. SPIE - The International Society of Optical Engineering

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