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Method for testing aspheric surface with wavelength scanning interferometry

著者名:
  • C. Xue ( Changchun Univ. of Science and Technology, China )
  • F. Huo ( Changchun Univ. of Science and Technology, China )
  • H. Lv ( Mcoptics Co. Ltd., China )
掲載資料名:
Optical test and measurement technology and equipment
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6723
発行年:
2007
巻:
1
開始ページ:
67231V-1
終了ページ:
67231V-7
総ページ数:
7
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819468802 [0819468800]
言語:
英語
請求記号:
P63600/6723
資料種別:
国際会議録

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