High order harmonics wavefront measurement and optimization

High order harmonics wavefront measurement and optimization

著者名:

J. Gautier ( Lab. d'Optique Appliquée (France) )
A. S. Morlens ( Lab. d'Optique Appliquée (France) )
P. Zeitoun ( Lab. d'Optique Appliquée (France) )
E. Papalarazou ( Lab. d'Optique Appliquée (France) )
G. Rey ( Lab. d'Optique Appliquée (France) )

掲載資料名:

Advances in metrology for x-ray and EUV optics II : 30 August 2007, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6704

発行年:

2007

開始ページ:

670403-1

終了ページ:

670403-6

総ページ数:

6

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468529 [0819468525]

言語:

英語

請求記号:

P63600/6704

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052350
シリーズID:	PA00000029
会議名:	SPIE Optical Engineering and Applications : Advances in Metrology for X-Ray and EUV Optics
回次:	2007 : 2nd
会議開催地:	San Diego, California, USA
会議開催年:	2007.08.30
論文注記:	Advances in Metrology for X-Ray and EUV Optics II, August 30, 2007, San Diego, CA, USA - Session 1 (6704-02)

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