Analyses of structural films using effective refractive index model

Analyses of structural films using effective refractive index model

著者名:

T.-H. Chang ( National Central Univ. (Taiwan) )
Y.-W. Yeh ( National Central Univ. (Taiwan) )
S.-H. Chen ( National Central Univ. (Taiwan) )
C.-C. Lee ( National Central Univ. (Taiwan) )

掲載資料名:

Thin-film coatings for optical applications IV : 29-30 August 2007, San Diego, California, USA

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6674

発行年:

2007

開始ページ:

667405-1

終了ページ:

667405-8

総ページ数:

8

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819468222 [0819468223]

言語:

英語

請求記号:

P63600/6674

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052323
シリーズID:	PA00000029
会議名:	SPIE Optical Engineering and Applications : Thin-Film Coatings for Optical Applications
回次:	2007 : 4th
会議開催地:	San Diego, California, USA
会議開催年:	2007.08.29-2007.08.30
論文注記:	Thin-film coatings for optical applications IV, 29-30 August 2007, San Diego, CA, USA - Session 1. Innovative Film Structures and Measurements (667405)

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