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Image analyzing of patterns in dielectric barrier discharge

著者名:
  • H. Yue ( Hebei Univ. (China) )
  • L. Dong ( Hebei Univ. (China) )
  • Y. He ( Hebei Univ. (China) )
  • W. Fan ( Hebei Univ. (China) )
  • W. Liu ( Hebei Univ. (China) )
掲載資料名:
International Symposium on Photoelectronic Detection and Imaging 2007, related technologies and applications : 9-12 September 2007, Beijing China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6625
発行年:
2008
開始ページ:
66250O-1
終了ページ:
66250O-6
総ページ数:
6
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819467676 [0819467677]
言語:
英語
請求記号:
P63600/6625
資料種別:
国際会議録

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