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A method for simplifying phase-height mapping in phase measurement profilometry

著者名:
  • Y. Li ( Zhejiang Normal Univ. (China) )
  • X. Su ( Sichuan Univ. (China) )
  • H. Zhang ( Zhejiang Normal Univ. (China) )
掲載資料名:
International Symposium on Photoelectronic Detection and Imaging 2007, image processing : 9-12 September 2007, Beijing China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6623
発行年:
2008
開始ページ:
66230S-1
終了ページ:
66230S-7
総ページ数:
7
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819467652 [0819467650]
言語:
英語
請求記号:
P63600/6623
資料種別:
国際会議録

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