Study on the wavelength characteristics of the emission patterns in dielectric barrier discharge by photoelectricity method

Study on the wavelength characteristics of the emission patterns in dielectric barrier discharge by photoelectricity method

著者名:

S. Liu ( Hebei Univ. (China) )
L. Dong ( Hebei Univ. (China) )
W. Fan ( Hebei Univ. (China) )
S. Li ( Hebei Univ. (China) )

掲載資料名:

International Symposium on Photoelectronic Detection and Imaging 2007, laser, ultraviolet, and terahertz technology : 9-12 September 2007, Beijing China

シリーズ名:

Proceedings of SPIE - the International Society for Optical Engineering

シリーズ巻号:

6622

発行年:

2008

開始ページ:

66220W-1

終了ページ:

66220W-6

総ページ数:

6

出版情報:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819467645 [0819467642]

言語:

英語

請求記号:

P63600/6622

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00052302
シリーズID:	PA00000029
会議名:	International Symposium on Photoelectronic Detection and Imaging 2007
回次:	2007
会議開催地:	Beijing, China
会議開催年:	2007.09.09-2007.09.12
論文注記:	International Symposium on Photoelectronic Detection and Imaging 2007, 9-12 September 2007, Beijing, China (66220W)

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