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Effects of impurities with deep energy level in high biased field on delay time of semi-insulating GaAs photoconductive switches

著者名:
  • H. Dai ( Xi'an Univ. of Technology (China) )
  • W. Shi ( Xi'an Univ. of Technology (China) )
  • J. Hou ( Ordnance Engineering College (China) )
掲載資料名:
International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6621
発行年:
2008
開始ページ:
66211Q-1
終了ページ:
66211Q-6
総ページ数:
6
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819467638 [0819467634]
言語:
英語
請求記号:
P63600/6621
資料種別:
国際会議録

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