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Performance evaluation of CCD imaging systems with the square integral method based on MRC

著者名:
  • J. Wang ( Beijing Institute of Technology (China) )
  • W. Jin ( Beijing Institute of Technology (China) )
  • Y. He ( Beijing Institute of Technology (China) )
  • L. Wang ( Beijing Institute of Technology (China) )
掲載資料名:
International Symposium on Photoelectronic Detection and Imaging 2007, photoelectronic imaging and detection : 9-12 September 2007, Beijing China
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6621
発行年:
2008
開始ページ:
66210V-1
終了ページ:
66210V-11
総ページ数:
11
出版情報:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819467638 [0819467634]
言語:
英語
請求記号:
P63600/6621
資料種別:
国際会議録

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