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Evaluation of Single-Event Upset Tolerance on Recent Commercial Memory ICs

著者名:
Nemoto, N.
Matsuzaki, K.
Aoki, J.
Akiitsu, T.
Matsuda, S.
Naito, I.
Itoh, H.
Nashiyama, I.
さらに 3 件
掲載資料名:
Proceedings of the Third ESA Electronic Components Conference, EECC '97, ESTEC, Noordwijk, The Netherlands, 22-25 April 1997
シリーズ名:
ESA SP
シリーズ巻号:
395
発行年:
1997
開始ページ:
461
終了ページ:
466
総ページ数:
6
出版情報:
Noordwijk, The Netherlands: European Space Agency
ISSN:
03796566
ISBN:
9789290922636 [929092263X]
言語:
英語
請求記号:
E11690/395
資料種別:
国際会議録

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