Blank Cover Image

Detection limit of a Sagnac interferometer [6422-33]

著者名:
掲載資料名:
Optics in industry : Sixth Symposium : 8-9 March 2007, Monterrey, Mexico
シリーズ名:
Proceedings of SPIE - the International Society for Optical Engineering
シリーズ巻号:
6422
発行年:
2007
開始ページ:
64220Y
出版情報:
Bellingham, WA: SPIE
ISSN:
0277786X
ISBN:
9780819465320 [0819465321]
言語:
英語
請求記号:
P63600/6422
資料種別:
国際会議録

類似資料:

Palma-Vargas, S., Sandoval-Romero, E. G., Ramirez-Ibarra, A.

SPIE - The International Society of Optical Engineering

Estudillo-Ayala, J. M., Placencia-Villanueva, A., Rojas-Laguna, R., Toledo-Garcia, T., Alvarado-Mendez, E., …

SPIE - The International Society of Optical Engineering

Ramirez-Ibarra, A., Sandoval-Romero, E. G., Garcia-Valenzuela, A., Palma-Vargas, S.

SPIE - The International Society of Optical Engineering

Ibarra-Escamilla, B., Kuzin, E.A., Haus, J.W., Pottiez, O., Gomez-Garcia, D.E., Gutierrez-Zainos, F., Mendoza-Vazquez, …

SPIE-The International Society for Optical Engineering

Ramirez-Ibarra, A., Palma-Vargas, S., Sandoval-Romero, G. E.

SPIE - The International Society of Optical Engineering

9 国際会議録 DINAMICO [6422-08]

A. Nava Vega, J. R. Juárez Ramírez, E. Álvarez Guzmán, J. V. Ruiz López, G. Zapata Rodríguez

SPIE

Palma-Vargas, S., Sandoval-Romero, G. E., Ramirez-Ibarra, A.

SPIE - The International Society of Optical Engineering

Kuzin, E.A., Ibarra-Escamilla, B., Haus, J.W., Gomez-Garcia, D.E.

SPIE - The International Society of Optical Engineering

J. Paredes Jaramillo, J. Castillo Mixcóatl, G. Beltrán Pérez, S. Aguirre Muñoz, J. A. Palma Vargas

SPIE

G. Sun, D. S. Moon, A. Lin, W. -T. Han, Y. Chung

Society of Photo-optical Instrumentation Engineers

Estudillo-Ayala, J.M., Rojas-Laguna, R., Andrade-Lucio, J.A., Alvarado-Mendez, E., Ibarra-Manzano, O.G., …

SPIE-The International Society for Optical Engineering

Ojeda-Nava, C., Sandoval-Romero, E. G.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12