Determination of AlGaN/GaN HEMT Reliability Using Optical Pumping as a Characterization Method

Determination of AlGaN/GaN HEMT Reliability Using Optical Pumping as a Characterization Method

著者名:

D. Cheney

掲載資料名:

Reliability and materials issues of III-V and II-VI semiconductor optical and electron devices and materials II : symposium held April 9-13, 2012, San Francisco, California, U.S.A.

シリーズ名:

Materials Research Society symposium proceedings

シリーズ巻号:

1432

発行年:

2012

開始ページ:

143

終了ページ:

150

総ページ数:

8

出版情報:

Warrendale, PA: Materials Research Society

ISSN:

02729172

ISBN:

9781605114095 [160511409X]

言語:

英語

請求記号:

M23500/1432

資料種別:

国際会議録

詳細

TDL書誌ID:	ZA00051892
シリーズID:	PA00000011
会議名:	2012 MRS Spring Meeting ; Symposium G, Reliability and Materials Issues of II-VI and III-V Semiconductor Optical and Electron Devices and Materials II
回次:	2012
会議開催地:	San Francisco, CA
会議開催年:	2012.04.09-2012.04.13

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