Characterization of InGaN and InAlN Epilayers by Microdiffraction X-Ray Reciprocal Space Mapping
- 著者名:
V. Kachkanov I.P. Dolbnya K.P. O'Donnell K. Lorenz S. Pereira R.W. Martin P.R. Edwards I.M. Watson - 掲載資料名:
- Compound semiconductors for generating, emitting, and manipulating energy : symposium held November 28-December 2, 2011, Boston, Massachusetts, U.S.A.
- シリーズ名:
- Materials Research Society symposium proceedings
- シリーズ巻号:
- 1396
- 発行年:
- 2012
- 開始ページ:
- 193
- 終了ページ:
- 198
- 総ページ数:
- 6
- 出版情報:
- Warrendale, PA: Materials Research Society
- ISSN:
- 02729172
- ISBN:
- 9781605113739 [1605113735]
- 言語:
- 英語
- 請求記号:
- M23500/1396
- 資料種別:
- 国際会議録
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1
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Electron Micro-Probe Analysis and Cathodoluminescence Spectroscopy of Rare Earth-Implanted GaN
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