Effect of Switching from High to Low Dose Rate on Linear Bipolar Technology Radiation Response
- 著者名:
Boch, Jerome Saigne, Frederic Schrimpf, Ron D. Fleetwood, Dan M. Ducret, Samuel Dusseau, Laurent David, Jean-Pierre Fesquet, Jean Gasiot, Jean Ecoffet, Robert - 掲載資料名:
- Proceedings of the 7th European Conference on Radiation and its Effects on Components and Systems : RADECS 2003, 15-19 September 2003, Noordwijk, the Netherlands
- シリーズ名:
- ESA SP
- シリーズ巻号:
- 536
- 発行年:
- 2004
- 開始ページ:
- 537
- 終了ページ:
- 546
- 総ページ数:
- 10
- 出版情報:
- Noordwijk, the Netherlands: ESA Publication Division
- ISSN:
- 03796566
- ISBN:
- 9789290928461 [9290928468]
- 言語:
- 英語
- 請求記号:
- E11690/536
- 資料種別:
- 国際会議録
類似資料:
1
国際会議録
Elevated Temperature Irradiation at High Dose Rate of Commercial Linear Bipolar Integrated Circuits
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